PEEM/XAS beamline

PEEM/XAS BEAMLINE (Photoemission Electron Microscopy / X-ray Absorption Spectroscopy) - the bending magnet beamline is dedicated to microscopy and spectroscopy in the absorption of soft X-rays. It is co-operated by the Jagiellonian University, Jerzy Haber Institute of Catalysis and Surface Chemistry PAS, and AGH University of Science and Technology in Kraków.


  • PEEM end-station (Photoemission Electron Microscopy) - an electron microscope that uses low energy electrons emitted from a sample after excitation with a photon source to create an image with a spatial (lateral) resolution of
    a few dozen nanometres.
  • XAS end-station - a universal station for X-ray absorption spectroscopy.

The beamline team:

  • dr Marcin Zając, SOLARIS Centre, phone: +48 12 664 41 59; email: mar.zajac(at)
  • prof. dr hab. Józef Korecki, Faculty of Physics & Applied Computer Science, AGH University of Science and Technology / Jerzy Haber Institute of Catalysis and Surface Chemistry Polish Academy of Sciences
  • dr hab. inż. Marcin Sikora, Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology 
  • dr inż. Tomasz Giela, CERIC-ERIC.​

Beamline leaflet
download PDF file

For the projects carried out at the PEEM/XAS beamline, in cooperation with the Surface Nanostructures Group, ICSC, we offer:

  • PhD student position in the project „Domain wall dynamics and magnetic texture behavior in magnetic films with Dzyaloshinskii-Moriya interaction”. Position available immediately for 34 months. For information contact dr. Piotr Mazalski, e-mail:

  • Postdoc position in the project „Magnetic nanoparticles on periodic iron oxide templates: Control of magnetism using particle - substrate interaction and external electric field”. 2-year position, with a possibility of extension, available spring/summer 2018. For information contact dr Nika Spiridis, e-mail:

Beamline optical scheme:

Beamline parameters:


Bending magnet (1.31 T)

Available (optimal) energy range

200–2000 eV (250–1800 eV)

Energy resolution ΔE/E

2.5 x 10-4 and better

Beam size at sample (H x V)

At focal point: 0.100 mm x 0.030 mm
In divergent beam: 2 mm x 5 mm

Photon flux at sample

4-8 x 1010 [ph/s/0.1%BW] for E < 1700 eV
1-4 x 1010 [ph/s/0.1%BW] for E > 1700 eV

Available technique



Linear (horizontal) and elliptical


PEEM end-station

XAS end-station