UARPES beamline

UARPES BEAMLINE - Angle-Resolved Photoelectron Spectroscopy (ARPES) allows for measurements of fundamental quantities, i.e. the energy and the momentum, describing a photoelectron state in the space outside the solid sample. If a spin selector is used additionally, a complete set of quantum numbers for the electron may be obtained. Then, within a so called sudden approximation, the electron energy, momentum and spin measured over the sample surface may be related, to binding energy, quasimomentum, and spin, that the electron had in the solid before the photoelectric event took place. Thus the electronic band structure of the studied solid is obtained experimentally. Beside this simple picture ARPES gives also detailed insights into complex electron – electron and electron – lattice interactions in the solid.

The importance of the ARPES technique for contemporary science and technology is widely recognized. Dedicated ARPES beamlines exist at almost all synchrotron radiation centers worldwide.

Beamline leaflet
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Many recent advances in materials science have been enabled by better understanding of the electronic structure of complex systems, gained due to ARPES studies. Examples include advances in fields such as:

  • high temperature superconductivity
  • topological insulators
  • graphene physics.

Contact person: Karolina Szamota-Leandersson, UARPES beamline manager, phone +48 519 307 968, +48 12 664 41 60, email: karolina.szamota-leandersson(at)

Beamline optical scheme:

Beamline parameters:

Elliptically polarizing undulator
(EPU) APPLE II type, quasiperiodic. Magnetic period length: 120 mm
Available energy range Total: 8–100 eV
NIM: 8 eV–30 eV
PGM: 16 eV–100 eV
Light polarisation Linear vertical, linear horizontal, circular, eliptical

Linear skewed. For the linear skewed polarisation the lower energy limit is 12 eV

Resolving power (RP) 20 000
Beam size at sample (H x V) NIM: 350 μm x 60 μm PGM: 270 μm x 30 μm
Photon flux at a sample min. 5 x 1011 photons/s @ 20 000 RP
Available techniques
Angle-resolved photoelectron spectroscopy (ARPES)
at sample temperature 8–500 K, low energy electron diffraction
(MCP-LEED), Auger electron spectroscopy (AES)
Electron spectrometer
energy resolution
1.8 meV
Angular resolution 0,1°
Available sample
preparation techniques
Cleaving, thermal annealing up to 1800 K, Ar+ ion
bombardment, thin firm growth, surface reactions
in the gas phase


UARPES beamline